The Filmetrics range of thin-film characterisation systems are used in as many applications as there are applications for the actual thin films themselves – which is to say thousands!
In spite of this broad application base, we have found that many applications fall within one of the categories.
- Amorphous & Polysilicon
- Dielectrics
- Hardcoat Thickness
- IC Failure Analysis
- ITO & Other TCOs
- Medical Devices
- Metal Thickness
- Microfluidics
- OLEDs
- Ophthalmic Coatings
- Parylene Coatings
- Photoresist
- Porous Silicon
- Process Films
- Refractive Index & k
- Silicon Wafers & Membranes
- Solar Applications
- Semiconductor Teaching Labs
- Surface Roughness & Finish
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TECHNOLOGIES
Optical profilers like ProFilm3D are interference microscopes and are used to measure height variations – such as surface roughness – on surfaces with great precision using the wavelength of light.
APPLICATIONS
Surface measurement, synonymous with surface metrology is able to determine surface topography, which is essential for confirming a surface’s suitability for its function.
PRODUCTS
View our vast array of products, which can all be tailor made to your specifications, from the world’s leading suppliers – DME, Filmetrics, LMI, Filmetrics and more!