We provide instrumentation and consulting for measurement of surface roughness, waviness and shape; layer thickness and optical properties ranging from the sub-nanometer to the cm scales along with surface modification and laser lithography. Drawing on over 20 years of scientific training and technical experience we aim to offer a lot more than simply supplying equipment.
“This work would not have been possible without the magnificent interferometer, and certainly would not have been achievable without all of your kind help – from the first time we saw the instrument at CERAM, up until the present day.“
“We purchased our white light interferometer from Omniscan about seven years ago after an extensive review of available instruments for measuring surface topography. The level of technical support, service and after sales care has been superb from initial installation and training through to ongoing advice and new product updates.“