Low Coherence Interferometry

OptoFlat, designed for production quality control and incoming quality assurance of polished plano optical components is a low cost, high performance flatness interferometer.

Proprietary, engineered coherence interferometry
OptoFlat was designed as a low coherence interferometer to measure plane-parallel transparent polished surfaces without special treatment of the backside. Thin glass wafers and disks of 300 microns thickness or more are easily measured. Just position on the integrated stage, adjust focus position and tilt and with a wave of the hand, a measurement of flatness is performed.

Sub-nanometer measurements are routine. No other interferometer in this price range can compete with the precision and capabilities for measurement of flatness and transmitted wavefront of plano optical components.

Interference artifacts are suppressed or totally eliminated through the engineered coherence of the novel OptoFlat design. By using an extended source, dust, scratches and nanometer scale surface variations within the optical train do not produce artifacts in the measurement. Polish process fingerprints are clearly seen. Improvements can rapidly be made to a process by using OptoFlat to monitor and document successive iterations.

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TECHNOLOGIES

Optical profilers like ProFilm3D are interference microscopes and are used to measure height variations – such as surface roughness – on surfaces with great precision using the wavelength of light.

APPLICATIONS

Surface measurement, synonymous with surface metrology is able to determine surface topography, which is essential for confirming a surface’s suitability for its function.

PRODUCTS

View our vast array of products, which can all be tailor made to your specifications, from the world’s leading suppliers – DME, Filmetrics, LMI, Filmetrics and more!