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Applications

Laser Lithography

In various markets around the globe, Heidelberg Instruments Systems are being used for fabricating microstructures on various materials in such disparate areas as production lines for display technologies to Biomedical Engineering research. Heidelberg Instruments Systems are used in the production of flat panel displays and advanced electronic packaging.

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Scanning Probe and Atomic Force Microscopy

Whether you need to measure sub-nanometer surface topography or roughness or you need to observe cancer cells, AFM offers the ability to do this and more. If optical imaging is not able to give the resolution required or if SEM requires too much sample preparation, then perhaps AFM can offer.

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Scanning Probe and Atomic Force Microscopy

Whether you need to measure sub-nanometer surface topography or roughness or you need to observe cancer cells, AFM offers the ability to do this and more. If optical imaging is not able to give the resolution required or if SEM requires too much sample preparation, then perhaps AFM can offer.

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Thin Film Characterisation

The Filmetrics range of thin-film characterisation systems are used in as many applications as there are applications for the actual thin films themselves – which is to say thousands! In spite of this broad application base.

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Ultra Thin Film Characterisation

The next generation Film Sense Multi-Wavelength Ellipsometer systems are now available! Film Sense FS-1EX and FS-1UV ellipsometers provide enhanced thin film measurement capabilities, with more wavelengths and wider spectral ranges.

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Ultra Thin Film Characterisation

The next generation Film Sense Multi-Wavelength Ellipsometer systems are now available! Film Sense FS-1EX and FS-1UV ellipsometers provide enhanced thin film measurement capabilities, with more wavelengths and wider spectral ranges.

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Shape Measurement

Surface shape is the overall geometry of the area of interest, where the area of interest can vary according to the application. For example, if you were measuring the topography of a micro-lens, “shape” might be described as a measurement of the lens’s curvature, as compared to a manufacturing specification.

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Flatness Measurement

OptoFlat, designed for production quality control and incoming quality assurance of polished plano optical components is a low cost, high performance flatness interferometer.

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Flatness Measurement

OptoFlat, designed for production quality control and incoming quality assurance of polished plano optical components is a low cost, high performance flatness interferometer.

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Waviness Measurement

Waviness is the measurement of the more widely spaced component of surface texture. It is a broader view of roughness because it is more strictly defined as “the irregularities whose spacing is greater than the roughness sampling length”.

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Roughness & Texture Measurement

Surface measurement—synonymous with surface metrology—determines surface topography, which is essential for confirming a surface’s suitability for its function. Surface measurement conceptually includes surface shape, surface finish, surface profile roughness (Ra), or in surface area roughness (Sa), surface texture, asperity and structural characterization.

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Roughness & Texture Measurement

Surface measurement—synonymous with surface metrology—determines surface topography, which is essential for confirming a surface’s suitability for its function. Surface measurement conceptually includes surface shape, surface finish, surface profile roughness (Ra), or in surface area roughness (Sa), surface texture, asperity and structural characterization.

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