APPLICATIONS
Thin Film Characterisation
The Filmetrics range of thin-film characterisation systems are used in as many applications as there are applications for the actual thin films themselves – which is to say thousands! In spite of this broad application base.
Ultra-Thin Film Characterisation
The next generation Film Sense Multi-Wavelength Ellipsometer systems are now available! Film Sense FS-1EX and FS-1UV ellipsometers provide enhanced thin film measurement capabilities, with more wavelengths and wider spectral ranges.
Shape Measurement
Surface shape is the overall geometry of the area of interest, where the area of interest can vary according to the application. For example, if you were measuring the topography of a micro-lens, “shape” might be described as a measurement of the lens’s curvature, as compared to a manufacturing specification.
Sheet Resistance Measurement
The 4PP contact four-point probe configuration is recommended for thin metal and ion implant layers, and the non-contact Eddy Current (EC) probe is recommended for thicker metal layers and soft or flexible conductive surfaces.
Flatness Measurement
OptoFlat, designed for production quality control and incoming quality assurance of polished plano optical components is a low cost, high performance flatness interferometer
Waviness Measurement
Waviness is the measurement of the more widely spaced component of surface texture. It is a broader view of roughness because it is more strictly defined as “the irregularities whose spacing is greater than the roughness sampling length”.
Roughness & Texture Measurement
Surface measurement—synonymous with surface metrology—determines surface topography, which is essential for confirming a surface’s suitability for its function. Surface measurement conceptually includes surface shape, surface finish, surface profile roughness (Ra), or in surface area roughness (Sa), surface texture, asperity and structural characterization.