Thin Film Characterisation

The Filmetrics range of thin-film characterisation systems are used in as many applications as there are applications for the actual thin films themselves – which is to say thousands!
In spite of this broad application base, we have found that many applications fall within one of the categories.
  • Amorphous & Polysilicon
  • Dielectrics
  • Hardcoat Thickness
  • IC Failure Analysis
  • ITO & Other TCOs
  • Medical Devices
  • Metal Thickness
  • Microfluidics
  • OLEDs
  • Ophthalmic Coatings
  • Parylene Coatings
  • Photoresist
  • Porous Silicon
  • Process Films
  • Refractive Index & k
  • Silicon Wafers & Membranes
  • Solar Applications
  • Semiconductor Teaching Labs
  • Surface Roughness & Finish
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Optical profilers like ProFilm3D are interference microscopes and are used to measure height variations – such as surface roughness – on surfaces with great precision using the wavelength of light.


Surface measurement, synonymous with surface metrology is able to determine surface topography, which is essential for confirming a surface’s suitability for its function.


View our vast array of products, which can all be tailor made to your specifications, from the world’s leading suppliers – DME, Filmetrics, LMI, Filmetrics and more!