Scanning Probe and Atomic Force Microscopy
Whether you need to measure sub-nanometer surface topography or roughness or you need to observe cancer cells, AFM offers the ability to do this and more.
Laser Lithography
The Know How to build high resolution maskless laser lithography systems is the result of a long period of experience collected in this area. After about 5 years in an academic environment, followed by 17 years in an industrial environment, we have learned to master the various tools to build…
Laser Lithography
The Know How to build high resolution maskless laser lithography systems is the result of a long period of experience collected in this area. After about 5 years in an academic environment, followed by 17 years in an industrial environment, we have learned to master the various tools to build…
Spectrophotometry
Optical techniques are usually the preferred method for measuring thin films because they are accurate, non-destructive, and require little or no sample preparation. Optical techniques can determine the thickness, roughness and optical constants of a film.
Digital Fringe Projection
Fringe patterns consisting of parallel stripes are projected onto the object surface, and their perspective deformation is recorded by a camera. The high number of points acquired simultaneously delivers even the smallest details.
Digital Fringe Projection
Fringe patterns consisting of parallel stripes are projected onto the object surface, and their perspective deformation is recorded by a camera. The high number of points acquired simultaneously delivers even the smallest details.
White Light Interferometry
An Optical profiler like The ProFilm3D are used to measure surface height variations such as surface roughness and topography on a wide variety of surfaces with very high levels of precision that use the wavelength of light as their ruler.
Ellipsometry
The next generation Film Sense Multi-Wavelength Ellipsometer systems are now available! Film Sense FS-1EX and FS-1UV ellipsometers provide enhanced thin film measurement capabilities, with more wavelengths and wider spectral ranges.
Ellipsometry
The next generation Film Sense Multi-Wavelength Ellipsometer systems are now available! Film Sense FS-1EX and FS-1UV ellipsometers provide enhanced thin film measurement capabilities, with more wavelengths and wider spectral ranges.
Low Coherence Interferometry
OptoFlat, designed for production quality control and incoming quality assurance of polished plano optical components is a low cost, high performance flatness interferometer.
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