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Scanning Probe and Atomic Force Microscopy

Whether you need to measure sub-nanometer surface topography or roughness or you need to observe cancer cells, AFM offers the ability to do this and more.

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Laser Lithography

The Know How to build high resolution maskless laser lithography systems is the result of a long period of experience collected in this area. After about 5 years in an academic environment, followed by 17 years in an industrial environment, we have learned to master the various tools to build…

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Laser Lithography

The Know How to build high resolution maskless laser lithography systems is the result of a long period of experience collected in this area. After about 5 years in an academic environment, followed by 17 years in an industrial environment, we have learned to master the various tools to build…

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Spectrophotometry

Optical techniques are usually the preferred method for measuring thin films because they are accurate, non-destructive, and require little or no sample preparation. Optical techniques can determine the thickness, roughness and optical constants of a film.

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Digital Fringe Projection

Fringe patterns consisting of parallel stripes are projected onto the object surface, and their perspective deformation is recorded by a camera. The high number of points acquired simultaneously delivers even the smallest details.

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Digital Fringe Projection

Fringe patterns consisting of parallel stripes are projected onto the object surface, and their perspective deformation is recorded by a camera. The high number of points acquired simultaneously delivers even the smallest details.

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White Light Interferometry

An Optical profiler like The ProFilm3D are used to measure surface height variations such as surface roughness and topography on a wide variety of surfaces with very high levels of precision that use the wavelength of light as their ruler.

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Ellipsometry

The next generation Film Sense Multi-Wavelength Ellipsometer systems are now available! Film Sense FS-1EX and FS-1UV ellipsometers provide enhanced thin film measurement capabilities, with more wavelengths and wider spectral ranges.

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Ellipsometry

The next generation Film Sense Multi-Wavelength Ellipsometer systems are now available! Film Sense FS-1EX and FS-1UV ellipsometers provide enhanced thin film measurement capabilities, with more wavelengths and wider spectral ranges.

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Low Coherence Interferometry

OptoFlat, designed for production quality control and incoming quality assurance of polished plano optical components is a low cost, high performance flatness interferometer.

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