An Optical profiler like The ProFilm3D is used to measure surface height variations such as surface roughness and topography on a wide variety of surfaces with very high levels of precision that use the wavelength of light as their ruler.
The Profilm3D® optical profilometer is an affordable, non-contact, white light interferometry-based (WLI) 3D surface topography measurement system and is used to measure surface height variations such as surface roughness and topography on a wide variety of surfaces with very high levels of precision that use the wavelength of light as their ruler.
The systems utilise optical interference profiling which is a well-established method of obtaining accurate surface topography and interfacial layer thickness measurements. The latest generation of the white light interferometer includes new imaging modes that extend performance and value. The Profilm3D series measures nanometre- to millimetre-scale surface features with a simple, flexible recipe setup, accommodating single scans or automated measurements on multiple sites to support both R&D and production environments.
