Accurate characterisation of thin films is essential across a wide range of industries, from semiconductors to photovoltaics. Utilising advanced Film Sense multi-wavelength ellipsometer systems can provide precise, non-destructive thin film measurements for research, quality control, and production applications.
What is Ellipsometry?
Ellipsometry is an optical technique used to determine the thickness and optical properties (such as refractive index and extinction coefficient) of thin films. It works by measuring changes in the polarisation state of light reflected from a surface. Because it is non-contact and highly sensitive, ellipsometry is especially suited for ultra-thin coatings, multilayer structures, and transparent or semi-transparent materials.
Why Film Sense Multi-Wavelength Ellipsometers?
Choose Film Sense technology for its unique combination of speed, simplicity, and accuracy. Unlike traditional spectroscopic ellipsometers that rely on complex mechanical components or time-consuming spectral scanning, Film Sense systems use multiple discrete wavelengths simultaneously. This provides rapid measurements with excellent repeatability—ideal for both R&D and production environments.
Key advantages include:
- Fast and Accurate Results: Multi-wavelength analysis enables quick acquisition of data with high sensitivity, even on ultra-thin films.
- User-Friendly Interface: The Film Sense platform offers intuitive software, making analysis and model fitting straightforward for users at any skill level.
- Compact and Versatile: Its small footprint allows easy integration into lab spaces or production lines, and it supports a wide range of sample types and sizes.
- Non-Destructive Analysis: Measure without altering or damaging the sample, preserving its integrity for further processing.
Applications of Ellipsometer Systems Across Multiple Industries
Ellipsometer systems are suitable for a diverse array of materials and applications, including:
- Semiconductor and microelectronics manufacturing
- Optical coatings and anti-reflective films
- Photovoltaic and display technologies
- Thin film research and development
- Nanomaterials and functional coatings
Whether you are measuring a few nanometres of oxide or analysing multilayer stacks, our Film Sense systems offer the precision and flexibility needed for dependable characterisation.
If your project demands precise, reliable thin film analysis, Film Sense multi-wavelength ellipsometry offers a proven, efficient solution. Contact Omniscan today to learn how our optical measurement services can support your process, enhance your product quality, and streamline your development cycle.