Omniscan is a supplier of leading edge surface analysis instrumentation and metrology solutions to industry and academia. Omniscan has provided high quality and focussed solutions to academic and industrial customers for the past 20 years.
LMI Technologies digital fringe projection systems directly measure surface height and topography information from just a few phase shifted fringe patterns.
Filmetrics spectral reflectance systems: 10Å to 10mm? No Problem. Thin-Film Thickness Measurement and More.
An Optical profiler like The ProFilm3D is used to measure surface height variations such as surface roughness and topography on a wide variety of surfaces with very high levels of precision that use the wavelength of light as their ruler.
Filmetrics R-Series resistivity mapping tools marry the sheet resistance technology developed and perfected by KLA for over 45 years with the benchtop instrument technology and user interface refined over the last 20 years by the Filmetrics team.
The next generation Film Sense Multi-Wavelength Ellipsometer systems are now available! Film Sense FS-1EX and FS-1UV ellipsometers provide enhanced thin film measurement capabilities, with more wavelengths and wider spectral ranges.
OptoFlat was designed as a low coherence interferometer to measure plane-parallel transparent polished surfaces without special treatment of the backside.
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“We purchased our white light interferometer from Omniscan about seven years ago after an extensive review of available instruments for measuring surface topography. The level of technical support, service and after sales care has been superb from initial installation and training through to ongoing advice and new product updates.“
“This work would not have been possible without the magnificent interferometer, and certainly would not have been achievable without all of your kind help – from the first time we saw the instrument at CERAM, up until the present day.“
