Optical surface profiling

Profilm3D – The World’s First Affordable 3D Profilometer

Profilm3D is an 3D optical surface profiler that uses White Light Interferometry to measure surface height variations on a wide variety of surfaces with very high levels of precision.

These White Light Interferometer systems use the wavelength of light as their ruler to obtain accurate surface topography, surface roughness and interfacial layer thickness measurements from the millimeter to the sub-nanometer scale. The latest generation of the Profilm3D also include enhanced imaging modes for the measurement of rough surfaces and highly-sloped sidewalls. The user friendly software feature a simple, flexible recipe setup along with single or automated scans at multiple sites to support both R&D and production applications.

Key Features

Vertical scanning and phase shifting interferometry for measurement of surface features from nanometres to millimetres

TotalFocus 3D imaging with optimised focus for each pixel through the full measured range

True-Colour imaging produces the actual sample colours for enhanced visualisation, especially for subtle or buried features

Enhanced Roughness Mode (ERM) increases fringe contrast for improved fidelity on sloped surfaces such as lenses and enables signal improvement for rough surfaces

Automated focus with industry-leading long piezo travel range for scanning multiple surfaces separated by large height distances

Automated X-Y stage with a long travel range, great for mapping and stitching scans

Intuitive software suite including advanced Profilm desktop, the cloud-based ProfilmOnline and mobile applications for flexible data storage, visualisation and analysis

High quality measurement data

Powerful tool capabilities

500µm Z piezo travel

About Us

Omniscan is a supplier of leading edge surface analysis instrumentation and metrology solutions to industry and academia.
We have provided high quality and focussed solutions to academic and industrial customers for the past 20 years.

Surface topography can occur over various lateral scales and is usually described in terms of the three categories listed below. Click the links to find out more information:

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TECHNOLOGIES

Optical profilers like ProFilm3D are interference microscopes and are used to measure height variations – such as surface roughness – on surfaces with great precision using the wavelength of light.

APPLICATIONS

Surface measurement, synonymous with surface metrology is able to determine surface topography, which is essential for confirming a surface’s suitability for its function.

PRODUCTS

View our vast array of products, which can all be tailor made to your specifications, from the world’s leading suppliers – DME, Filmetrics, LMI, Filmetrics and more!

Manufacturer
Filmetrics

Filmetrics was founded in 1995 with the mission of making thin-film measurements simple and affordable.
Our approach, borne of the microelectronics and software revolution, results in film-thickness measurements that take less than a second – by operators who can be trained in minutes.